Talking about international LED related standards
At present, with the rapid development of the semiconductor lighting industry, the international standard attaches great importance to the development of LED test standards. For example, the National Institute of Standards Testing (NIST) is conducting research on LED test methods and is preparing to establish a complete set of LED test methods and standards. Japan has also established the "White Light LED Test Research Committee", which specializes in testing methods and technical standards for white LEDs for lighting.
In order to seize the LED opportunity, the developed countries in the world have invested a lot of manpower and resources in LED standards and testing. In terms of standards, they pay attention to the selection of LED characteristic parameters and test methods. At the same time, many foreign large companies' research and development personnel are actively participating in national and international specialized organizations to develop semiconductor lighting test standards. For example, in the past, Lumileds and Nichia of Japan announced that they have cross-licensed their respective LED technologies and are preparing to jointly develop power LED standards to promote market applications.
Current Status of Lighting LED Standards and Testing Technologies The International Commission on Illumination (CIE) and the International Electrotechnical Commission (IEC) do not have standards for LED lighting. Strictly speaking, there is currently no standard in foreign countries for semiconductor lighting, only the test standards for ordinary LEDs and the lighting standards related to ordinary light sources. Common LED test standards are:
1.IEC60747-5 Semiconductor devices Discrete devices and integrated circuits (1992)
IEC60747-5 semiconductor discrete device and integrated circuit
2. IEC60747-5-2 Discrete semiconductor devices and integrated circuits-Part 5-2: Optoelectronic devices-Essential ratings and characteristics (1997-09)
IEC60747-5-2 Discrete Semiconductor Devices and Integrated Circuit Components 5-2: Optoelectronic Devices - Classification Features and Elements (1997-09)
3.IEC60747-5-3 Discrete semiconductor devices and integrated circuits-Part 5-3 : Optoelectronic devices-Measuring methods(1997-08)
IEC60747-5-3 discrete semiconductor device and integrated circuit
Parts 5-3: Optoelectronic Devices - Test Methods (1997-08)
4.IEC60747-12-3 Semiconductor devices-part12-3: optoelectronic devices –Blank detail specification for light-emitting diodes –Display application(1998-02)
IEC60747-12-3 Semiconductor Discrete Device 12-3: Optoelectronic Devices - Detail Standard for Blanks for Displaying Light Emitting Diodes (1998-02)
5.CIE127-1997 Measurement of LEDs (1997)
CIE127-1997 LED Test Method (1997)
6.CIE/ISO standards on LED intensity measurements
CIE/ISO LED intensity test standard
The International Commission on Illumination (CIE) published the CIE127-1997 LED test method in 1997, which determined the LED intensity test as the concept of average intensity and specified a uniform test structure and detector size, thus laying the foundation for accurate LED test comparison. . Although the CIE 127-1997 test method is not an international standard, it is easy to implement accurate test comparisons and is currently used by major companies around the world. However, with the rapid development of technology, many new LED technology features are not covered by the CIE127-1997 LED test method.
Now there are new developments in the market, and Japan is striving to create a complete LED standard. As the relevant standards become more and more clear, the development of the LED industry will be more stable.
Dalian Xinghai Technology Co., Ltd.